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| 樣品編號 | 檢測機構(gòu)的儀器測量插頭殘余電壓結(jié)果 | 企業(yè)的儀器測量插頭殘余電壓結(jié)果 |
| 1月1日 | 45.2V | 24.1V |
| 不合格 | 合格 | |
| 1-2(更換電源版) | 22.3V | 13.3V |
| 合格 | 合格 |
| Standard(s) (incl. year) | Subclause(s) | Tracking No. | Year |
| 標(biāo)準(zhǔn) | 條款 | 參考號 | 年 |
| IEC 60065 | 9.1.6 | DSH0716 | 2008 |
| IEC 60335 | 22.5 | ||
| IEC 60950 | 2.1.1.7 | ||
| IEC 61010 | 6.1.2, 6.10.3 | ||
| + any other as applicable | … | ||
| 任何適用的標(biāo)準(zhǔn) | |||
| Category 類別 | |||
| HOUS, MEAS, OFF, TRON, | |||
| Various… | |||
| 家電、測量、信息辦室、電子、其他各種 | |||
| Subject內(nèi)容 | Keywords關(guān)鍵詞 | Developed by 制訂者 | Approved at |
| 批準(zhǔn)在 | |||
| Probe impedance for plug discharge test | - Probe impedance探頭阻抗 | WG2 | 2009 CTL Plenary Meeting |
| 插頭放電測試探頭阻抗 | - Plug discharge插頭放電 | WG4 | 2009年CTL全體大會 |
| - >= 100 M? ≥100 M? | |||
| - 25 pF or less ≤25 pF | |||
| Question問題 | |||
| When the plug discharge test is performed using a voltage probe and oscilloscope for direct measurement of the voltage decay, what probe impedance shall be used to ensure uniform and comparable results? | |||
| Note: IEC 60950-1/2005 specifies 100 M? ± 5 M ? in parallel with an input capacitance of 20pF ± 5 pF. | |||
| 當(dāng)使用電壓探頭和示波器直接測量插頭殘余電壓時,應(yīng)使用什么阻抗的探頭確保一致的和可比較的結(jié)果? | |||
| 注:IEC 60950-1/2005規(guī)定100 MΩ±5 MΩ并聯(lián)電容為20pF±5 pF。 | |||
| Decision決議 | |||
| If the relevant standard does not contain contradictory requirements, a voltage probe having an input impedance of 100 M? or greater in parallel with an input capacitance of 25 pF or less, shall be used for this test. | |||
| For other (automatic) equipment with special measurement techniques equivalent measures shall be taken to ensure comparable results.如果相關(guān)標(biāo)準(zhǔn)不包含與本文件矛盾的要求,則試驗應(yīng)使用輸入阻抗大于等于100 MΩ且輸入電容小于等于25 pF的電壓探頭。 | |||
| 對于具有特殊測量技術(shù)的其他(自動)設(shè)備,應(yīng)采取同等措施,以確保獲得可比較的結(jié)果。 | |||
| Explanatory notes注釋 | |||
| This issue was raised at the 2008 CTL meeting after discussing the proficiency testing program on plug discharge 2007/2008. Participants used several different probe impedances, which caused inconsistent results. | |||
| 這一問題是在討論了2007/2008年插頭殘余電壓能力驗證方案之后,在2008年CTL會議上提出的。參與者使用了幾個不同阻抗的探頭,導(dǎo)致了不一致的測試結(jié)果。 | |||



來源:Internet